Scat96
This is a screen shot from the ion simulation appliacation I have
been writing. This application simulates the secondary ion mass
spectrometry (SIMS) process. It bombards the substarate atoms with
a projectile of high energy. It then follows this trajectory through
the crystal and calculates the amount of energy imparted to the
surface. This information can be used to determine how the atoms
of the surface will eject from it. By measuring these ejected ions
one can gain information on surface structure. It also reveals
surface composition as this technique is mass sensitive.
Please send comments or complaints to Alger Pike, Department of Chemistry
180 Materials Reasearch Institute.
ACP107@PSUVM.psu.edu
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