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Hebrew University of
Jerusalem Institute
of Earth Sciences
Givat Ram, Jerusalem 91904
ISRAEL
JEOL JXA-8600 "Superprobe"
Laboratory manager | Laboratory supervisor |
Elad Izraeli |
Prof. Alan Matthews |
(972) 2-658
58 97
Fax: (972) 2-566 25 81 edadi@earth.es.huji.ac.il |
(972)2-658
49 13
Fax: (972) 2-566 25 81 alan@vms.huji.ac.il |
The electron probe microanalyzer (EPMA)
is a major tool for qualitative and quantitative analyses that are performed
by bombarding a finely focused electron beam (electron probe) on the specimen,
and measuring the wavelength and intensities of the characteristic X-ray
emitted and intensities of secondary electrons and backscattered electrons.
One of the most outstanding features of the EPMA
is that it allows wide range elemental analysis and observation from an
ultra-microarea (5 mic.) to a wide area on the specimen surface without
destroying the specimen. This feature is very important in fields of research
including mineralogy, gemology, metallography, material sciences, chemistry,
physics, electronics biology, medicine, environmental science, and industrial
engineering.
The X-ray spectrometers are of the linear focusing type and cover a
wide range wavelength, and assure highly accurate and sensitive analysis.
The optical microscope for locating the point for analysis is provided
with a high resolution reflecting mirror objective with a hole, allowing
observation of the point on the specimen under electron beam bombardment.
In the microarea analyses, backscattered electrons provide useful information
on the topography and composition of the specimen. The JEOL
JXA-8600 is equipped with a high-performance backscattered electron
detector with high response characteristic at low acceleration voltages
and low probe current.
The Geology Department houses a JEOL JXA-8600
"Superprobe", installed in 1986. This EPMA
has one energy-dispersive (EDS) and 4 wavelength-dispersive
(WDS) spectrometers. The WDS
spectrometers
are loaded with LiF, PET, TAP, LOD and STE
crystals capable to detect all elements with atomic number greater than
5, i.e. from carbon and above.
The recently installed new NORAN VANTAGE digital X-ray microanalysis automation system is running on Windows 95/NT station and feature number of state of the art abilities such as:
For many graduate students and faculty members, the electron probe is
a perfect tool for their fields of research, including igneous, metamorphic
and experimental petrology (Alan
Matthews, Dov
Avigad, Oded
Navon), mineral investigation and geochronology (Yehoshua
Kolodny, Avi Burg, Lisa Heller-Kallai),
and other geological-mineralogical investigations.
Other users of the microprobe include: The School of Applied Science
and Technology, The Institute of Physics,
The
Institute of Chemistry, The Institute
of Life Science, The Hadassah Medical
School (all from The Hebrew University); The Israel Geological Survey,
The
Tel-Aviv University, The Antiquities Authority, The Israel Museum and
other academic and commercial organizations.
Quantitative mineral
analysis for silicate, oxide, sulphide, sulphate and carbonate minerals
X-ray mapping of trace elements in minerals
Trace element analysis of foraminifera
Study of inclusions in diamonds and other
minerals
Analysis of pigments and other archaeological
materials
Analysis of aerosols for atmospheric science
Backscattering imaging and photography for
mineralogy and geology
SEM imaging and photography for geology,
biology, and other applications
Quantitative analyses of artificial crystals,
alloys, ceramics, semi and super-conductors, optical fibers and other matter
for physics, chemical, electronic and material sciences