WELCOME TO  HOME PAGE

Hebrew University of Jerusalem  Institute of Earth Sciences
Givat Ram, Jerusalem 91904
ISRAEL

JEOL JXA-8600 "Superprobe"


Laboratory manager Laboratory supervisor

Elad Izraeli

Prof. Alan Matthews
(972) 2-658 58 97 
Fax: (972) 2-566 25 81 
edadi@earth.es.huji.ac.il
(972)2-658 49 13 
Fax: (972) 2-566 25 81 
alan@vms.huji.ac.il

 
Detailed description of our machine Uses of Electron Probe Microanalyzer Electron Probe Image Gallery
Specimens Preparation,Standards, Data Storage and Literature Charges of Electron Probe Laboratory Services Our WWW links


The Electron Microprobe

The electron probe microanalyzer (EPMA) is a major tool for qualitative and quantitative analyses that are performed by bombarding a finely focused electron beam (electron probe) on the specimen, and measuring the wavelength and intensities of the characteristic X-ray emitted and intensities of secondary electrons and backscattered electrons.
One of the most outstanding features of the EPMA is that it allows wide range elemental analysis and observation from an ultra-microarea (5 mic.) to a wide area on the specimen surface without destroying the specimen. This feature is very important in fields of research including mineralogy, gemology, metallography, material sciences, chemistry, physics, electronics biology, medicine, environmental science, and industrial engineering.
The X-ray spectrometers are of the linear focusing type and cover a wide range wavelength, and assure highly accurate and sensitive analysis.
The optical microscope for locating the point for analysis is provided with a high resolution reflecting mirror objective with a hole, allowing observation of the point on the specimen under electron beam bombardment.
In the microarea analyses, backscattered electrons provide useful information on the topography and composition of the specimen. The JEOL JXA-8600 is equipped with a high-performance backscattered electron detector with high response characteristic at low acceleration voltages and low probe current.
The Geology Department houses a JEOL JXA-8600 "Superprobe", installed in 1986. This EPMA has one energy-dispersive (EDS) and 4 wavelength-dispersive (WDS) spectrometers. The WDS spectrometers are loaded with LiF, PET, TAP, LOD and STE crystals capable to detect all elements with atomic number greater than 5, i.e. from carbon and above.

The recently installed new NORAN VANTAGE digital X-ray microanalysis automation system is running on Windows 95/NT station and feature number of state of the art abilities such as:

New Pioneer Norvar EDS X-ray detectorequipped with the ultra-thin window capable to detect all elements down to beryllium. This Si(Li) detector provides excellent collection efficiency with resolution of 133eV (Mn) and 65eV (F).



Typical Current Microprobe Projects

For many graduate students and faculty members, the electron probe is a perfect tool for their fields of research, including igneous, metamorphic and experimental petrology (Alan Matthews, Dov Avigad, Oded Navon), mineral investigation and geochronology (Yehoshua Kolodny, Avi Burg, Lisa Heller-Kallai), and other geological-mineralogical investigations.
Other users of the microprobe include: The School of Applied Science and Technology, The Institute of Physics, The Institute of Chemistry, The Institute of Life Science, The Hadassah Medical School (all from The Hebrew University); The Israel Geological Survey, The Tel-Aviv University, The Antiquities Authority, The Israel Museum and other academic and commercial organizations.

Quantitative mineral analysis for silicate, oxide, sulphide, sulphate and carbonate minerals
X-ray mapping of trace elements in minerals
Trace element analysis of foraminifera
Study of inclusions in diamonds and other minerals
Analysis of pigments and other archaeological materials
Analysis of aerosols for atmospheric science
Backscattering imaging and photography for mineralogy and geology
SEM imaging and photography for geology, biology, and other applications
Quantitative analyses of artificial crystals, alloys, ceramics, semi and super-conductors, optical fibers and other matter for physics, chemical, electronic and material sciences



Specimens Preparation

Samples for EPMA imaging and analysis consist of materials that are stable in a vacuum and under a high-voltage electron beam. Specimens for analyses must be fine polished (or naturally have a flat surface). For fine polishing we use the Struers diamond polishing machine Planopol-V & PDM-Force
equipped with magnetic disc.
For EPMA analyzing non-conductive samples must be coated with thinn carbon layer, that is also available in Electron Probe Preparation Laboratory by Edward's Coating System E306A. For SEM imagind we use a gold plating by Edwards Sputter Coater S150B.
Specimen mounts can be a common thin section (30 x 45 mm) or one inch diameter rounds, cylinders or other appropriate mounts, or irregular object with maximal diameter 90 mm and 25 mm thickness.
Standards
Standards for quantitative mineral analyses are different oxide, sulphide, sulphate, carbonate and natural silicate minerals, representatives of their mineral group. For other natural and artificial materials we have a various collection of standard compounds as well as metal standards. However, please confirm ahead that the appropriate standard exists.
Data storage
Storage of the output analyses is available on IBM PC onto hard disk, floppy disks, or 100 MB Iomega  ZIP Drive.
Literature
The in the laboratory we houses a small Electron Probe Library with up to date woks on Electron Microscopy and X-ray Microanalysis thematic.
Institute of Earth Sciences Library
Libraries in Israel Mt.Scopus LibraryHarman Science Library

Enter your e-mail address to receive e-mail when this page is updated.
Your Internet e-mail address:



This page constructed by Vitaly Gutkin ,
please contact Elad Izraeli for any comments,
recommendations or suggestions.

Copyright ©, 2000, The Hebrew University of Jerusalem. All Rights Reserved.