Hebrew University of
of Earth Sciences
Givat Ram, Jerusalem 91904
JEOL JXA-8600 "Superprobe"
|Laboratory manager||Laboratory supervisor|
Prof. Alan Matthews
| (972) 2-658
Fax: (972) 2-566 25 81
Fax: (972) 2-566 25 81
|Detailed description of our machine||Uses of Electron Probe Microanalyzer||Electron Probe Image Gallery|
|Specimens Preparation,Standards, Data Storage and Literature||Charges of Electron Probe Laboratory Services||Our WWW links|
The electron probe microanalyzer (EPMA)
is a major tool for qualitative and quantitative analyses that are performed
by bombarding a finely focused electron beam (electron probe) on the specimen,
and measuring the wavelength and intensities of the characteristic X-ray
emitted and intensities of secondary electrons and backscattered electrons.
One of the most outstanding features of the EPMA is that it allows wide range elemental analysis and observation from an ultra-microarea (5 mic.) to a wide area on the specimen surface without destroying the specimen. This feature is very important in fields of research including mineralogy, gemology, metallography, material sciences, chemistry, physics, electronics biology, medicine, environmental science, and industrial engineering.
The X-ray spectrometers are of the linear focusing type and cover a wide range wavelength, and assure highly accurate and sensitive analysis.
The optical microscope for locating the point for analysis is provided with a high resolution reflecting mirror objective with a hole, allowing observation of the point on the specimen under electron beam bombardment.
In the microarea analyses, backscattered electrons provide useful information on the topography and composition of the specimen. The JEOL JXA-8600 is equipped with a high-performance backscattered electron detector with high response characteristic at low acceleration voltages and low probe current.
The Geology Department houses a JEOL JXA-8600 "Superprobe", installed in 1986. This EPMA has one energy-dispersive (EDS) and 4 wavelength-dispersive (WDS) spectrometers. The WDS spectrometers are loaded with LiF, PET, TAP, LOD and STE crystals capable to detect all elements with atomic number greater than 5, i.e. from carbon and above.
The recently installed new NORAN VANTAGE digital X-ray microanalysis automation system is running on Windows 95/NT station and feature number of state of the art abilities such as:
Typical Current Microprobe Projects
For many graduate students and faculty members, the electron probe is
a perfect tool for their fields of research, including igneous, metamorphic
and experimental petrology (Alan
Navon), mineral investigation and geochronology (Yehoshua
Kolodny, Avi Burg, Lisa Heller-Kallai),
and other geological-mineralogical investigations.
Other users of the microprobe include: The School of Applied Science and Technology, The Institute of Physics, The Institute of Chemistry, The Institute of Life Science, The Hadassah Medical School (all from The Hebrew University); The Israel Geological Survey, The Tel-Aviv University, The Antiquities Authority, The Israel Museum and other academic and commercial organizations.
analysis for silicate, oxide, sulphide, sulphate and carbonate minerals
X-ray mapping of trace elements in minerals
Trace element analysis of foraminifera
Study of inclusions in diamonds and other minerals
Analysis of pigments and other archaeological materials
Analysis of aerosols for atmospheric science
Backscattering imaging and photography for mineralogy and geology
SEM imaging and photography for geology, biology, and other applications
Quantitative analyses of artificial crystals, alloys, ceramics, semi and super-conductors, optical fibers and other matter for physics, chemical, electronic and material sciences