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 | Volumes 101 - 109 (2004 - 2009) | |||||||
| Volume 109, Issue 4 - selected pp. 287-380 (March 2009) | |||||||
| Volume 109, Issue 3 pp. 201-286 (February 2009) | |||||||
 | Volume 109, Issue 2 pp. 139-200 (January 2009) | |||||||
| Volume 109, Issue 1 pp. 1-138 (December 2008) | |||||||
| Volume 108, Issue 12 pp. 1501-1658 (November 2008) | |||||||
| Volume 108, Issue 11 pp. 1401-1500 (October 2008) Proceedings of the Eleventh Conference on Frontiers of Electron Microscopy in Materials Science | |||||||
| Volume 108, Issue 10 pp. 999-1400 (September 2008) Proceedings of the Ninth International Conference on Scanning Probe Micrososcopy, Sensors and Nanostructures | |||||||
| Volume 108, Issue 9 pp. 805-998 (August 2008) | |||||||
| Volume 108, Issue 8 pp. 707-804 (July 2008) | |||||||
| Volume 108, Issue 7 pp. 613-706 (June 2008) | |||||||
| Volume 108, Issue 6 pp. 503-612 (May 2008) | |||||||
| Volume 108, Issue 5 pp. 393-502 (April 2008) | |||||||
| Volume 108, Issue 4 pp. 295-392 (March 2008) | |||||||
| Volume 108, Issue 3 pp. 159-294 (February 2008) Proceedings of the Sixteenth International Microscopy Congress | |||||||
| Volume 108, Issue 2 pp. 69-158 (January 2008) | |||||||
| Volume 108, Issue 1 pp. 1-68 (December 2007) | |||||||
| Volume 107, Issue 12 pp. 1123-1212 (November 2007) | |||||||
| Volume 107, Issues 10-11 pp. 869-1122 (October 2007) Proceedings of the Eighth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures | |||||||
| Volume 107, Issue 9 pp. 705-868 (September 2007) Proceedings of the 50th International Field Emission Symposium & the 19th International Vacuum Nanoelectronics Conference | |||||||
| Volume 107, Issue 8 pp. 559-704 (August 2007) | |||||||
| Volume 107, Issues 6-7 pp. 431-558 (June-July 2007) Proceedings of the Electron Crystallography School 2005, ELCRYST 2005: New Frontiers in Electron Crystallography | |||||||
| Volume 107, Issues 4-5 pp. 275-430 (April-May 2007) | |||||||
| Volume 107, Issues 2-3 pp. 73-274 (February-March 2007) | |||||||
| Volume 107, Issue 1 pp. 1-72 (January 2007) | |||||||
| Volume 106, Issues 11-12 pp. 963-1168 (October-November 2006) Proceedings of the International Workshop on Enhanced Data Generated by Electrons | |||||||
| Volume 106, Issue 10 pp. 889-962 (August-September 2006) | |||||||
| Volume 106, Issues 8-9 pp. 637-888 (June-July 2006) Proceedings of the Seventh International Conference on Scanning Probe Microscopy, Sensors and Nanostructures | |||||||
| Volume 106, Issue 7 pp. 547-636 (May 2006) | |||||||
| Volume 106, Issue 6 pp. 449-546 (April 2006) | |||||||
| Volume 106, Issues 4-5 pp. 255-448 (March 2006) | |||||||
| Volume 106, Issue 3 pp. 153-254 (February 2006) | |||||||
| Volume 106, Issue 2 pp. 57-152 (January 2006) | |||||||
| Volume 106, Issue 1 pp. 1-56 (December 2005) | |||||||
| Volume 105, Issues 1-4 pp. 1-358 (November 2005) Proceedings of the Sixth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures | |||||||
| Volume 104, Issues 3-4 pp. 169-340 (October 2005) | |||||||
| Volume 104, Issue 2 pp. 83-167 (September 2005) | |||||||
| Volume 104, Issue 1 pp. 1-82 (August 2005) | |||||||
| Volume 103, Issue 4 pp. 255-341 (July 2005) | |||||||
| Volume 103, Issue 3 pp. 173-253 (June 2005) | |||||||
| Volume 103, Issue 2 pp. 95-172 (May 2005) | |||||||
| Volume 103, Issue 1 pp. 1-93 (April 2005) Proceedings of the Ninth Conference on Frontiers of Electron Microscopy in Materials Science | |||||||
| Volume 102, Issue 4 pp. 257-347 (March 2005) | |||||||
| Volume 102, Issue 3 pp. 173-255 (February 2005) | |||||||
| Volume 102, Issue 2 pp. 85-171 (January 2005) | |||||||
| Volume 102, Issue 1 pp. 1-84 (December 2004) | |||||||
| Volume 101, Issues 2-4 pp. 47-283 (November 2004) | |||||||
| Volume 101, Issue 1 pp. 1-46 (October 2004) | |||||||
 | Volumes 91 - 100 (2002 - 2004) | |||||||
| Volumes 81 - 90 (2000 - 2002) | |||||||
| Volumes 71 - 80 (1998 - 1999) | |||||||
| Volumes 61 - 70 (1995 - 1998) | |||||||
| Volumes 51 - 60 (1993 - 1995) | |||||||
| Volumes 41 - 50 (1992 - 1993) | |||||||
| Volumes 31 - 40 (1989 - 1992) | |||||||
| Volumes 21 - 30 (1987 - 1989) | |||||||
| Volumes 11 - 20 (1983 - 1986) | |||||||
| Volumes 1 - 10 (1975 - 1982) | |||||||
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| IFC (Editorial Board) Page IFC &_cdi=5549&_sort=d&_docanchor=&_ct=14&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&_fmt=full&md5=42293b7288659daf98003e52edd17a46','B6TW1-4VV2H2J-1-abs','B6TW1-4VV2H2J-1-figs','B6TW1-4VV2H2J-1-refs','B6TW1-4VV2H2J-1-img','/scidirimg/preview_off.gif','/scidirimg/preview_on.gif') "Open") Preview  Purchase PDF (1543 K)
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| A rapid method to correct objective lens astigmatism in a TEM Pages 287-290 Q. Xing, T.A. Lograsso &_cdi=5549&_sort=d&_docanchor=&_ct=14&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&_fmt=full&md5=c32aa08abea5297dd117538ca048725b','B6TW1-4V34DD3-3-abs','B6TW1-4V34DD3-3-figs','B6TW1-4V34DD3-3-refs','B6TW1-4V34DD3-3-img','/scidirimg/preview_off.gif','/scidirimg/preview_on.gif') "Open") Preview Purchase PDF (684 K)
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| Improve performance of scanning probe microscopy by balancing tuning fork prongs Pages 291-295 Boon Ping Ng, Ying Zhang, Shaw Wei Kok, Yeng Chai Soh &_cdi=5549&_sort=d&_docanchor=&_ct=14&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&_fmt=full&md5=88084d7b0edf56b98a98d6dd3794b034','B6TW1-4V74XST-2-abs','B6TW1-4V74XST-2-figs','B6TW1-4V74XST-2-refs','B6TW1-4V74XST-2-img','/scidirimg/preview_off.gif','/scidirimg/preview_on.gif') "Open") Preview Purchase PDF (802 K)
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| Tomographic spectroscopic imaging; an experimental proof of concept Pages 296-303 W. Van den Broek, J. Verbeeck, D. Schryvers, S. De Backer, P. Scheunders &_cdi=5549&_sort=d&_docanchor=&_ct=14&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&_fmt=full&md5=b9553b120f71f2b950508151de562f4d','B6TW1-4V3SY8K-2-abs','B6TW1-4V3SY8K-2-figs','B6TW1-4V3SY8K-2-refs','B6TW1-4V3SY8K-2-img','/scidirimg/preview_off.gif','/scidirimg/preview_on.gif') "Open") Preview Purchase PDF (674 K)
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| A high-speed area detector for novel imaging techniques in a scanning transmission electron microscope Pages 304-311 T.A. Caswell, P. Ercius, M.W. Tate, A. Ercan, S.M. Gruner, D.A. Muller &_cdi=5549&_sort=d&_docanchor=&_ct=14&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&_fmt=full&md5=5991268c0e50e360f7ca1360b79a9a67','B6TW1-4V3HHJK-2-abs','B6TW1-4V3HHJK-2-figs','B6TW1-4V3HHJK-2-refs','B6TW1-4V3HHJK-2-img','/scidirimg/preview_off.gif','/scidirimg/preview_on.gif') "Open") Preview Purchase PDF (1353 K)
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| Practical factors affecting the performance of a thin-film phase plate for transmission electron microscopy Pages 312-325 Radostin Danev, Robert M. Glaeser, Kuniaki Nagayama &_cdi=5549&_sort=d&_docanchor=&_ct=14&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&_fmt=full&md5=49bdd5ddb42c79c2aa318170f4507de8','B6TW1-4V47CK8-1-abs','B6TW1-4V47CK8-1-figs','B6TW1-4V47CK8-1-refs','B6TW1-4V47CK8-1-img','/scidirimg/preview_off.gif','/scidirimg/preview_on.gif') "Open") Preview Purchase PDF (1939 K)
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| Four-dimensional STEM-EELS: Enabling nano-scale chemical tomography Pages 326-337 Konrad Jarausch, Paul Thomas, Donovan N. Leonard, Ray Twesten, Christopher R. Booth &_cdi=5549&_sort=d&_docanchor=&_ct=14&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&_fmt=full&md5=bd31a7dca8e30b06d3012d9adeafcabe','B6TW1-4V9S47R-1-abs','B6TW1-4V9S47R-1-figs','B6TW1-4V9S47R-1-refs','B6TW1-4V9S47R-1-img','/scidirimg/preview_off.gif','/scidirimg/preview_on.gif') "Open") Preview Purchase PDF (1453 K)
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| Probe retrieval in ptychographic coherent diffractive imaging Pages 338-343 Pierre Thibault, Martin Dierolf, Oliver Bunk, Andreas Menzel, Franz Pfeiffer &_cdi=5549&_sort=d&_docanchor=&_ct=14&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&_fmt=full&md5=e536ec359cc90615333335cb7de87aa6','B6TW1-4V99T8M-1-abs','B6TW1-4V99T8M-1-figs','B6TW1-4V99T8M-1-refs','B6TW1-4V99T8M-1-img','/scidirimg/preview_off.gif','/scidirimg/preview_on.gif') "Open") Preview Purchase PDF (959 K)
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| A fluorescence scanning electron microscope Pages 344-349 Takaaki Kanemaru, Kazuho Hirata, Shin-ichi Takasu, Shin-ichiro Isobe, Keiji Mizuki, Shuntaro Mataka, Kei-ichiro Nakamura &_cdi=5549&_sort=d&_docanchor=&_ct=14&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&_fmt=full&md5=a609e75e4da8b2ad2c2e9f69cc065d13','B6TW1-4VCH716-1-abs','B6TW1-4VCH716-1-figs','B6TW1-4VCH716-1-refs','B6TW1-4VCH716-1-img','/scidirimg/preview_off.gif','/scidirimg/preview_on.gif') "Open") Preview Purchase PDF (1002 K)
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| Image simulation of high resolution energy filtered TEM images Pages 350-360 Jo Verbeeck, Peter Schattschneider, Andreas Rosenauer &_cdi=5549&_sort=d&_docanchor=&_ct=14&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&_fmt=full&md5=8aa9b3e42117e966f2a01168402ac6c2','B6TW1-4VCWG88-1-abs','B6TW1-4VCWG88-1-figs','B6TW1-4VCWG88-1-refs','B6TW1-4VCWG88-1-img','/scidirimg/preview_off.gif','/scidirimg/preview_on.gif') "Open") Preview Purchase PDF (2003 K)
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| Effects of electron channeling in HAADF-STEM intensity in La2CuSnO6 Pages 361-367 M. Haruta, H. Kurata, H. Komatsu, Y. Shimakawa, S. Isoda &_cdi=5549&_sort=d&_docanchor=&_ct=14&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&_fmt=full&md5=fe921916a8cfaafc5bd6b384f6107db1','B6TW1-4VCH716-2-abs','B6TW1-4VCH716-2-figs','B6TW1-4VCH716-2-refs','B6TW1-4VCH716-2-img','/scidirimg/preview_off.gif','/scidirimg/preview_on.gif') "Open") Preview Purchase PDF (988 K)
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| Sharing of secondary electrons by in-lens and out-lens detector in low-voltage scanning electron microscope equipped with immersion lens Pages 368-372 Kazuhiro Kumagai, Takashi Sekiguchi &_cdi=5549&_sort=d&_docanchor=&_ct=14&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&_fmt=full&md5=9c0c3d2eb07a60194a6034d15c9e280b','B6TW1-4VF570J-1-abs','B6TW1-4VF570J-1-figs','B6TW1-4VF570J-1-refs','B6TW1-4VF570J-1-img','/scidirimg/preview_off.gif','/scidirimg/preview_on.gif') "Open") Preview Purchase PDF (370 K)
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| Field enhancement factor and field emission from a hemi-ellipsoidal metallic needle Pages 373-378 Evgeny G. Pogorelov, Alexander I. Zhbanov, Yia-Chung Chang &_cdi=5549&_sort=d&_docanchor=&_ct=14&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&_fmt=full&md5=5f654aca199e5c894eeb9745fc168399','B6TW1-4VFC831-1-abs','B6TW1-4VFC831-1-figs','B6TW1-4VFC831-1-refs','B6TW1-4VFC831-1-img','/scidirimg/preview_off.gif','/scidirimg/preview_on.gif') "Open") Preview Purchase PDF (472 K)
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| Corrigendum to “Novel carbon nanosheets as support for ultrahigh-resolution structural analysis of nanoparticles” [Ultramicroscopy 108 (2008) 885–892] Page 379 Christoph T. Nottbohm, Andre Beyer, Alla S. Sologubenko, Inga Ennen, Andreas Hütten, Harald Rösner, Wolfgang Eck, Joachim Mayer, Armin Gölzhäuser &_cdi=5549&_sort=d&_docanchor=&_ct=14&_acct=C000050221&_version=1&_urlVersion=0&_userid=10&_fmt=full&md5=912dd4c8d007f1a87713f00f85afdf5a','B6TW1-4VDY854-1-abs','B6TW1-4VDY854-1-figs','B6TW1-4VDY854-1-refs','B6TW1-4VDY854-1-img','/scidirimg/preview_off.gif','/scidirimg/preview_on.gif') "Open") Preview Purchase PDF (76 K)
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