November 1st - 4th, 2010
San Jose, CA, USA
Fast Abstract Submission: August 15, 2010
Acceptance Notification: September 2010
Camera Ready Copy: September 24, 2010
A Fast Abstract is a lightly reviewed, two-page technical article that requires a short talk at ISSRE. The goal of a Fast Abstract is to promote current work, research, practices, opinions, experiences, and issues. A Fast Abstract is an early communication of technical work and does not always require completed results like a conference/journal publication. Authors can introduce new ideas to the community or state positions on controversial issues. The history and genesis of Fast Abstracts and past archives can be found at The Fast Abstract History. Fast Abstracts are an integral and important part of ISSRE. Accepted papers will be published in the supplemental proceedings of the 21st International Symposium on Software Reliability Engineering. Authors will present a short talk at ISSRE. Fast Abstracts sessions have been among the most attended in past ISSRE conferences, with contributors as diverse as young students and distinguished members of the community.
Scope Authors should explain the contribution to the field and the novelty of the work, making clear the current status of the work. Topics of interest include, but are not limited to:
Review and Evaluation Criteria Each submission will be lightly reviewed by two to three members of the Fast Abstracts Program Committee and final decisions will be made about which submissions to accept for presentation at ISSRE. Submissions will be evaluated based on the technical merit, relevance, and significance.
Submission Structure Submissions must conform to the IEEE Format and Submission Guidelines and should not exceed two pages (including all text, figures, references and appendices). The results described must be unpublished and should not be under review elsewhere. Each accepted submission will be allotted a maximum of two pages in the final proceedings and must be presented by one of the authors. The final version of accepted papers must conform to the IEEE Format and Submission Guidelines.
Tudor Dumitras, Carnegie Mellon University, USA
Sameh Elnikety, Microsoft Research, UK
David Lo, Singapore Management University, Singapore
Leonardo Mariani, University of Milano Bicocca, Italy (Chair)
Mattia Monga, University of Milan, Italy
Henry Muccini, University of L'Aquila, Italy
George Porter, UC San Diego, USA