Course: Semiconductor Contacts: Their Science, Fabrication, and Characterization Course Objectives
Course Description This two day course reviews the basic concepts of potential barrier formation at metal/semiconductor interfaces and discusses charge transfer processes that determine whether a contact is ohmic. Methods for preparing contacts (i.e., sputtering, chemical vapor deposition, etc.) are also discussed, with particular emphasis on the effect of preparation techniques on fundamental properties. Contacts to a variety of materials, including Si, III-V, and II-VI semiconductors, are considered. Characterization techniques are discussed in detail. These include barrier height measurements (i.e., current/voltage, capacitance/voltage, and photo response techniques) and specific contact resistance measurements (i.e., transmission line and Kelvin bridge methods). The approach is to supplement a historical discussion of fundamentals with current research and development in the field of contact technology. This also includes information about the reliability of contacts and interconnects, which is of great significance to the electronics industry. Who Should Attend? Instructor: Course Materials: Cost: $850.00 |