ANFF at The University of Melbourne
The University of Melbourne through the Melbourne Materials Institute (MMI) has made available a wide range of tools and facilities to the ANFF user community, notably including
- Ion-beam implantation, doping and analytical techniques including IBIC and PIXE
- Electronic property measurement including DLTS
- Specialised biocompatible electronics and materials including diamond deposition
- High density electronic packaging including bump-bonding
Contacts
| Mr Irving Liaw | +61 3 8344 0176 | iliaw @ unimelb.edu.au |
| A/Prof. Jeff McCallum | +61 3 8344 8072 | jeffreym @ unimelb.edu.au |
http://materials.unimelb.edu.au/
(deprecated:)
|
Jeff McCallum |
Melbourne University | 03 8344 8072 jeffreym@unimelb.edu.au |
| Thin film deposition | Pulsed laser deposition | |
| Characterisation |
Atomic scale imaging (Transmission electron microscopy, STM, in vacuum, air and at different temperatures) | |
| Characterisation | Ultra high field nuclear magnetic resonance spectroscopy | |
| Characterisation |
Advanced spectroscopic techniques, allowing the detection and characterisation of single nanoparticles. | |
| Characterisation | Agilent 8453 UV-VIS Spectrophotometer | |
| Characterisation |
Cary 4000 UV-VIS Spectrophotometer (with diffuse reflectance accessory | |
| Characterisation | Ellipsometry | |
| Characterisation | Quartz crystal microgravimetry | |
| Characterisation | Raman spectroscopy | |
| Characterisation | Varian 7000 Fourier Transform-IR Spectrophotometer | |
| Characterisation | Dynamic light scattering | |
| Characterisation | Malvern HPPS particle sizer (DLS) | |
| Characterisation | Malvern Zetasizer | |
| Sample handling | Automated Sample Handling | |
| Characterisation | JEOL JAFM 4500XT UHV AFM | |
| Characterisation | Staib Surface Spectroscopy facility | |
| Characterisation | JEOL AFM (JSTM 4200A) | |
| Characterisation |
Nanonics NSOM/AFM, coupled to the Renishaw micro-Raman spectrometer. | |
| Characterisation | NT-MDT SMENA portable AFM | |
| Characterisation |
NEC 5U Pelletron, operating as a high brightness source of light ions operating at charging potentials of 0.5 to 5 MeV | |
| Materials fabrication | Ion Implantation | |
| Characterisation | Rutherford Backscattering (RBS) | |
| Characterisation | Proton Induced X-ray emission (PIXE) | |
| Characterisation | Ion Beam Induced Charge measurements (IBIC) | |
| Characterisation | Channelling Contrast Microscopy (CCM) | |
| Characterisation | Scanning Transmission Ion Microscopy (STIM) | |
| Fabrication/Characterisation |
Orsay Physics Focussed Ion Beam (FIB) with crossed electron beam for performing concurrent SEM measurements | |
| Device fabrication |
Colutron low energy ion implanter (0.01-15 keV) predominantly used for phosphorus implantation of Quantum Devices | |
| Laboratory | Class 350 Cleanroom | |
| Laboratory | Class 35 laminar flow cabinet | |
| Thin film deposition | Astex microwave HPMD/ECR system for diamond coating | |
| Laboratory | Wet chemical processing facility | |
| Materials fabrication | Inert gas furnace annealing | |
| Characterisation | Time-resolved reflectivity | |
| Lithography |
Neutronix Quintel Q4000-6 UV Photolithographic Processing | |
| Characterisation | Star Cryo-electronics DC SQUID | |
| Characterisation | SULA Deep Level Transient Spectroscopy system (DLTS) | |
| Characterisation | Dilor XY triple grating, high resolution spectrometer | |
| Characterisation |
Reinshaw RM 1000 single grating, extended wavelength Raman/luminescence system, including a Coherent 190 FRED, Kimmon HeCd and Stellar Pro 514 Modulaser | |
| Characterisation | Micro-Raman Spectrometer | |
